This is the old XigmaNAS forum in read only mode,
it will taken offline by the end of march 2021!
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Its not possible for us to export from here and import it to the main forum!
it will taken offline by the end of march 2021!
I like to aks Users and Admins to rewrite/take over important post from here into the new fresh main forum!
Its not possible for us to export from here and import it to the main forum!
Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
Moderators: b0ssman, apollo567, Princo, crowi
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Mike
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Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
Hallo, wie ernst muß man folgende Meldung nehmen:"Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!"?
Ansonsten läuft alles bestens.
Gruß Mike
Ansonsten läuft alles bestens.
Gruß Mike
- crowi
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
Das würde ich sehr ernst nehmen und den nettgemeinten Vorschlag Deiner Platte schleunigst umsetzen; BACK UP DATA NOW!.
Was sagen die SMART Werte?
Was sagen die SMART Werte?
NAS 1: Milchkuh: Asrock C2550D4I, Intel Avoton C2550 Quad-Core, 16GB DDR3 ECC, 5x3TB WD Red RaidZ1 +60 GB SSD for ZIL/L2ARC, APC-Back UPS 350 CS, NAS4Free 11.0.0.4.3460 embedded
NAS 2: Backup: HP N54L, 8 GB ECC RAM, 4x4 TB WD Red, RaidZ1, NAS4Free 11.0.0.4.3460 embedded
NAS 3: Office: HP N54L, 8 GB ECC RAM, 2x3 TB WD Red, ZFS Mirror, APC-Back UPS 350 CS NAS4Free 11.0.0.4.3460 embedded
NAS 2: Backup: HP N54L, 8 GB ECC RAM, 4x4 TB WD Red, RaidZ1, NAS4Free 11.0.0.4.3460 embedded
NAS 3: Office: HP N54L, 8 GB ECC RAM, 2x3 TB WD Red, ZFS Mirror, APC-Back UPS 350 CS NAS4Free 11.0.0.4.3460 embedded
- b0ssman
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
wenn du diese nachricht bekommst ist es meist schon zu spät für daten auf der platte.
hoffe mal das deine anderen platten im array keine ure haben.
hoffe mal das deine anderen platten im array keine ure haben.
Nas4Free 11.1.0.4.4517. Supermicro X10SLL-F, 16gb ECC, i3 4130, IBM M1015 with IT firmware. 4x 3tb WD Red, 4x 2TB Samsung F4, both GEOM AES 256 encrypted.
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Mike
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 153 148 021 Pre-fail Always - 7325
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 789
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 4854
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 784
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 19
193 Load_Cycle_Count 0x0032 195 195 000 Old_age Always - 15015
194 Temperature_Celsius 0x0022 132 115 000 Old_age Always - 18
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
Zusatz:Jun 2 08:53:40 asserver smartd[1832]: Device: /dev/ada1, found in smartd database: Western Digital Caviar Green (AF, SATA 6Gb/s)
Jun 2 08:53:40 asserver smartd[1832]: Device: /dev/ada1, is SMART capable. Adding to "monitor" list.
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 153 148 021 Pre-fail Always - 7325
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 789
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 4854
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 784
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 19
193 Load_Cycle_Count 0x0032 195 195 000 Old_age Always - 15015
194 Temperature_Celsius 0x0022 132 115 000 Old_age Always - 18
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
Zusatz:Jun 2 08:53:40 asserver smartd[1832]: Device: /dev/ada1, found in smartd database: Western Digital Caviar Green (AF, SATA 6Gb/s)
Jun 2 08:53:40 asserver smartd[1832]: Device: /dev/ada1, is SMART capable. Adding to "monitor" list.
- b0ssman
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
du hast 6 platten, das sind nur die werte von einer platte
Du findest die unter Diagnostics|Information|S.M.A.R.T.
Du findest die unter Diagnostics|Information|S.M.A.R.T.
Nas4Free 11.1.0.4.4517. Supermicro X10SLL-F, 16gb ECC, i3 4130, IBM M1015 with IT firmware. 4x 3tb WD Red, 4x 2TB Samsung F4, both GEOM AES 256 encrypted.
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Mike
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
das ist aber die defekte
- b0ssman
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
ja aber der smart befehl gibt weitere daten aus. poste alles von
Diagnostics|Information|S.M.A.R.T.
Diagnostics|Information|S.M.A.R.T.
Nas4Free 11.1.0.4.4517. Supermicro X10SLL-F, 16gb ECC, i3 4130, IBM M1015 with IT firmware. 4x 3tb WD Red, 4x 2TB Samsung F4, both GEOM AES 256 encrypted.
- b0ssman
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
es kann ja sein das /dev/ada1 komplett ausgefallen ist und jetzt eine andere platte /dev/ada1 ist
Nas4Free 11.1.0.4.4517. Supermicro X10SLL-F, 16gb ECC, i3 4130, IBM M1015 with IT firmware. 4x 3tb WD Red, 4x 2TB Samsung F4, both GEOM AES 256 encrypted.
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Mike
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Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
ja, aber dann würde doch irgendwo degraded stehen.
Gerät /dev/ada1 - Western Digital Caviar Green (AF, SATA 6Gb/s)
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green (AF, SATA 6Gb/s)
Device Model: WDC WD20EZRX-00DC0B0
Serial Number: WD-WCC1T1616903
LU WWN Device Id: 5 0014ee 208f0183f
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jun 2 14:13:03 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
Error SMART Status command failed
Please get assistance from
http://smartmontools.sourceforge.net/
Register values returned from SMART Status command are:
CMD=0xb0
FR =0xda
NS =0x401a
SC =0x95
CL =0xb9
CH =0x1c
RETURN =0x0000
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
No failed Attributes found.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (28200) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 285) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x70b5) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 153 148 021 Pre-fail Always - 7325
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 790
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 4856
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 785
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 19
193 Load_Cycle_Count 0x0032 195 195 000 Old_age Always - 15022
194 Temperature_Celsius 0x0022 130 115 000 Old_age Always - 20
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 4728 hours (197 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef aa 00 00 00 00 40 00 04:25:47.851 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 40 00 04:25:47.845 SET FEATURES [Set transfer mode]
ef 03 46 00 00 00 40 00 04:25:47.841 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 40 00 04:25:47.840 IDENTIFY DEVICE
Error 2 occurred at disk power-on lifetime: 4728 hours (197 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 40 00 04:25:47.845 SET FEATURES [Set transfer mode]
ef 03 46 00 00 00 40 00 04:25:47.841 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 40 00 04:25:47.840 IDENTIFY DEVICE
Error 1 occurred at disk power-on lifetime: 4728 hours (197 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 40 00 04:25:47.841 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 40 00 04:25:47.840 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Gerät /dev/ada1 - Western Digital Caviar Green (AF, SATA 6Gb/s)
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green (AF, SATA 6Gb/s)
Device Model: WDC WD20EZRX-00DC0B0
Serial Number: WD-WCC1T1616903
LU WWN Device Id: 5 0014ee 208f0183f
Firmware Version: 80.00A80
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jun 2 14:13:03 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
Error SMART Status command failed
Please get assistance from
http://smartmontools.sourceforge.net/
Register values returned from SMART Status command are:
CMD=0xb0
FR =0xda
NS =0x401a
SC =0x95
CL =0xb9
CH =0x1c
RETURN =0x0000
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
No failed Attributes found.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (28200) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 285) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x70b5) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 153 148 021 Pre-fail Always - 7325
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 790
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 4856
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 785
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 19
193 Load_Cycle_Count 0x0032 195 195 000 Old_age Always - 15022
194 Temperature_Celsius 0x0022 130 115 000 Old_age Always - 20
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 4728 hours (197 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef aa 00 00 00 00 40 00 04:25:47.851 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 40 00 04:25:47.845 SET FEATURES [Set transfer mode]
ef 03 46 00 00 00 40 00 04:25:47.841 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 40 00 04:25:47.840 IDENTIFY DEVICE
Error 2 occurred at disk power-on lifetime: 4728 hours (197 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 40 00 04:25:47.845 SET FEATURES [Set transfer mode]
ef 03 46 00 00 00 40 00 04:25:47.841 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 40 00 04:25:47.840 IDENTIFY DEVICE
Error 1 occurred at disk power-on lifetime: 4728 hours (197 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 40 00 04:25:47.841 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 40 00 04:25:47.840 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
- b0ssman
- Forum Moderator

- Posts: 2438
- Joined: 14 Feb 2013 08:34
- Location: Munich, Germany
- Status: Offline
Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
von den smart werten sieht die platte ok aus.
was die ABRT probleme betreffen kann ich keine aussage treffen.
die fehler scheinen aber alle folgefehler vom ersten zu sein.
was die ABRT probleme betreffen kann ich keine aussage treffen.
die fehler scheinen aber alle folgefehler vom ersten zu sein.
Nas4Free 11.1.0.4.4517. Supermicro X10SLL-F, 16gb ECC, i3 4130, IBM M1015 with IT firmware. 4x 3tb WD Red, 4x 2TB Samsung F4, both GEOM AES 256 encrypted.
-
Mike
- Advanced User

- Posts: 257
- Joined: 01 Apr 2014 17:30
- Status: Offline
Re: Device: /dev/ada1, FAILED SMART self-check. BACK UP DATA NOW!
Danke für die Mühe, das SMART ist für einen Nichtexperten wie mich schwierig zu interpretieren, auch bei Platten, die völlig ok arbeiten,tauchen unter SMART Fehler auf. Vielleicht ist die Umsetzung von SMART bei einigen Herstellern unterschiedlich.
Da es sich nicht um einen Backupserver handelt, warte ich einfach mal ab.
MfG Mike
Da es sich nicht um einen Backupserver handelt, warte ich einfach mal ab.
MfG Mike